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Staff Profile

Dr Sarah Olsen

Senior Lecturer

  • Email: sarah.olsen@ncl.ac.uk
  • Telephone: +44 (0) 191 208 8552
  • Fax: +44 (0) 191 208 8180
  • Address: E4.32
    Electrical and Electronic Engineering
    School of Engineering
    Merz Court
    缅北禁地
    缅北禁地 upon Tyne
    NE1 7RU, UK
Research
Sarah is a member of the .
Publications
  • Olsen SH, O'Neill AG, Driscoll LS, Kwa KSK, Chattopadhyay S, Waite AM, Tang YT, Evans AGR, Norris DJ, Cullis AG, Paul DJ, Robbins DJ. . IEEE Transactions on Electron Devices 2003, 50(9), 1961-1969.
  • Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Zhang J, Robbins DJ, Higgs V. . Journal of Applied Physics 2003, 94(10), 6855-6863.
  • Olsen SH, O'Neill AG, Driscoll LS, Chattopadhyay S, Kwa KSK, Waite AM, Tang YT, Evans AGR, Zhang J. . IEEE Transactions on Electron Devices 2004, 51(7), 1156-1163.
  • Olsen SH, O'Neill AG, Dobrosz P, Bull SJ, Driscoll LS, Chattopadhyay S, Kwa KSK. . Journal of Applied Physics 2005, 97(11), 1-9.
  • Olsen SH, O'Neill AG, Chattopadhyay S, Driscoll LS, Kwa KSK, Norris DJ, Cullis AG, Paul DJ. . IEEE Transactions on Electron Devices 2004, 51(8), 1245-1253.
  • Olsen SH, O'Neill AG, Bull SJ, Woods NJ, Zhang J. . Journal of Applied Physics 2002, 92(3), 1298-.
  • Yan L, Olsen SH, Escobedo-Cousin E, O'Neill AG. . Journal of Applied Physics 2008, 103(9), 094508.
  • Fobelets K, Rumyantsev SL, Shur MS, Olsen SH. . Journal of Applied Physics 2008, 103(4), 044501.
  • Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C. . IEEE Transactions on Electron Devices 2008, 55(6), 1568-1573.
  • Agaiby RMB, Olsen SH, Dobrosz P, Coulson H, Bull SJ, O'Neill AG. . In: 50th Electronic Materials Conference (EMC 2008). 2008, Santa Barbara, USA: The Minerals, Metals & Materials Society (TMS).
  • Agaiby RMB, Olsen SH, Dobrosz P, Coulson H, Bull SJ, O'Neill AG. . Journal of Applied Physics 2008, 104(1), 013507.
  • Olsen SH, Dobrosz P, Agaiby RMB, Tsang YL, Alatise O, Bull SJ, O'Neill AG, Moselund KE, Ionescu AM, Majhi P, Buca D, Mantl S, Coulson H. . In: E-MRS 2008 Spring Meeting. 2008, Strasbourg: Materials Science in Semiconductor Processing: Pergamon.
  • Dobrosz P, Olsen SH, Bull SJ, Tsang YL, Agaiby RMB, O'Neill AG, Buca D, Mantl S, Ghyselen B. . In: E-MRS 2008 Spring Conference. 2008, Strasbourg, France.
  • O'Neill AG, Agaiby R, Olsen S, Yang Y, Hellstrom P-E, Ostling M, Oehme M, Lyutovich K, Kasper E, Eneman G, Verheyen P, Loo R, Claeys C, Fiegna C, Sangiorgi E. . Applied Surface Science 2008, 254(19), 6182-6185.
  • Olsen SH, Tarawneh ZAl, Varzgar J, Escobedo-Cousin E, Agaiby RMB, Dobrosz P, O'Neill AG, Hellström P-E, Östling M, Parker E, Loo R, Claeys C. . In: 7th International Semiconductor Technology Conference. 2008, Shanghai, China: The Electrochemical Society.
  • Moselund KE, Dobrosz P, Olsen S, Pott V, De Michielis L, Tsamados D, Bouvet D, O'Neill A, Ionescu AM. . In: International Electron Devices Meeting (IEDM). 2007, Washington, DC: IEEE.
  • O'Neill AG, Olsen SH, Tsang YL, Dobrosz P. . In: Insulating Films on Semiconductors (INFOS). 2006, Athens, Greece.
  • Fobelets K, Rumyantsev SL, Olsen SH, Shur MS. . In: Advanced workshop on Frontiers in Electronics (WOFE). 2007, Cozumel, Mexico.
  • Tsang YL, Chattopadhyay S, Uppal S, Escobedo-Cousin E, Ramakrishnan HK, Olsen SH, O'Neill AG. . IEEE Transactions on Electron Devices 2007, 54(11), 3040-3048.
  • Olsen SH. . In: International Nanotechnology Conference (INC3). 2007, Brussels, Belgium.
  • Agaiby R, Yang Y, Olsen SH, O'Neill AG, Eneman G, Verheyen P, Loo R, Claeys C. . Solid-State Electronics 2007, 51(11-12), 1473-1478.
  • O'Neill AG, Olsen SH, Yang Y, Agaiby R, Hellstrom P-E, Ostling M, Lyutovich K, Kasper E, Eneman G, Verheyen P, Loo R, Claeys C, Fiegna C, Sangiorgi E. . In: International Symposium on Control of Semiconductor Interfaces (ISCSI-V). 2007, Tokyo, Japan.
  • O'Neill AG, Olsen SH, Yang Y, Agaiby R, Hellstrom P-E, Ostling M, Lyutovich K, Kasper E, Eneman G, Verheyen P, Loo R, Claeys C, Fiegna C, Sangiorgi E. . In: 3rd International Workshop on New Group IV Semiconductor Nanoelectronics. 2007, Sendai, Japan.
  • Olsen SH, Yan L, Agaiby R, Escobedo-Cousin E, O'Neill AG. . In: International Symposium on Advanced Gate Stack Technology (ISAGST). 2007, Dallas, USA.
  • Escobedo-Cousin E, Olsen SH, O'Neill AG, Alatise OM, Agaiby RMB, Dobrosz P, Braithwaite G, Cuthbertson A, Grasby T, Parker EHC. . In: Materials REsearch Society Conference (MRS). 2007, San Francisco, USA.
  • Escobedo-Cousin E, Olsen SH, Dobrosz P, Bull SJ, O'Neill AG, Coulson H, Claeys C, Loo R, Delhougne R, Caymax M. . Journal of Applied Physics 2007, 102(12), -.
  • Yan L, Olsen SH, Kanoun M, Al-Araimi M, Agaiby R, Dalapati GK, O'Neill AG. . In: 210th Electrochemical Society Meeting. 2006, Cancun, Mexico: ECS Transactions, Electrochemical Society, Inc.
  • Tsang YL, Chattopadhyay S, Kwa KSK, Dalapati GK, Agaiby R, O'Neill AG, Olsen SH. . In: International Conference on Electronic and Photonic Materials, Devices and Systems (EPMDS-2006). 2006, Calcutta, India.
  • Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG. . In: International Conference on Electronic and Photonic Material, Devices and Systems (EPMDS 2006). 2006, Calcutta, India.
  • Olsen SH, Escobedo-Cousin E, Varzgar JB, Agaiby R, Seger J, Dobrosz P, Chattopadhyay S, Bull SJ, O'Neill AG, Hellstrom P-E, Edholm J, Ostling M, Lyutovich KL, Oehme M, Kasper E. . IEEE Transactions on Electron Devices 2006, 53(9), 2296-2305.
  • O'Neill AG, Olsen SH, Escobedo-Cousin E, Agaiby R, Bull SJ, Coulson H, Claeys C, Loo R, Delougne R, Caymax M, Verheyen P, Eneman G. . In: International Conference on NANO-Structures Self-Assembling (NANOSea). 2006, Aix-en-Provence, France.
  • Olsen SH, Temple M, O'Neill AG, Paul DJ, Chattopadhyay S, Kwa KSK, Driscoll LS. . In: Fourth International Conference on Silicon Epitaxy and Heterostructures (ICSI-4). 2005, Awaji Island, Hyogo, Japan: Thin Solid Films: Elsevier.
  • Dalapati GK, Chattopadhyay S, Driscoll LS, O'Neill AG, Kwa KSK, Olsen SH. . Journal of Applied Physics 2006, 99(3), 024501.
  • Yan L, Olsen SH, Kanoun M, Agaiby R, O'Neill AG. . Journal of Applied Physics 2006, 100(10), 104507.
  • Varzgar JB, Chattopadhyay S, Uppal S, Chandra P, Olsen SH, O'Neill AG. . In: European Materials Research Society Conference (E-MRS). 2006, Nice, France.
  • Uppal S, Varzgar J, Chattopadhyay S, Olsen SH, O'Neill AG. . In: Proceedings of the European Materials Research Society Conference (E-MRS). 2006, Nice, France.
  • Uppal S, Kanoun M, Chattopadhyay S, Agaiby R, Olsen SH, Bull SJ, O'Neill AG. . In: Doping Engineering for Device Fabrication. 2006, San Francisco, USA: Materials Research Society.
  • Uppal S, Kanoun M, Varzgar JB, Chattopadhyay S, Olsen SH, O'Neill AG. . Material Science and Engineering B 2006, 135(3), 207-209.
  • Dalapati GK, Chattopadhyay S, Kwa KSK, Olsen SH, Tsang YL, Agaiby R, O'Neill AG, Dobrosz P, Bull SJ. . IEEE Transactions on Electron Devices 2006, 53(5), 1142-1152.
  • Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C. . In: European Solid State Device Research Conference (ESSDERC). 2006, Montreux, Switzerland.
  • Varzgar JB, Kanoun M, Uppal S, Chattopadhyay S, Tsang YL, Escobedo-Cousin E, Olsen SH, O'Neill AG, Hellstrom PE, Edholm J, Ostling M, Lyutovich K, Oehme M, Kasper E. . Material Science and Engineering B 2006, 135(3), 203-206.
  • Olsen SH, Dobrosz P, Escobedo-Cousin E, Agaiby RMB, Agaiby R, Bull SJ, O'Neill AG. . In: European Solid State Device Research Conference (ESSDERC) Workshop. 2006, Montreux, Switzerland.
  • O'Neill AG, Olsen SH, Escobedo-Cousin E, Varzgar JB, Agaiby R, Seger J, Dobrosz P, Chattopadhyay S, Bull SJ, Hellstrom P-E, Edholm J, Ostling M, Lyutovich K, Oehme M, Kasper E. . In: Symposium on Diagnostics & Yield: Advanced Silicon Devices and Technologies for the ULSI Era. 2006, Warsaw, Poland.
  • O'Neill AG, Olsen SH, Escobedo-Cousin E, Varzgar JB, Agaiby R, Chattopadhyay S, Dobrosz P, Bull SJ, Hellstrom P-E, Ostling M, Lyutovich K, Kasper E. . In: Solid-State and Integrated Circuit Technology Conference (ICSICT). 2006, Shanghai, China.
  • O'Neill AG, Olsen SH, Chattopadhyay S. . In: Proceedings of the International Conference on Electronic and Photonic Material, Devices and Systems (EPMDS). 2006, Calcutta, India.
  • O'Neill AG, Olsen SH, Escobedo-Cousin E, Varzgar JB, Agaiby R, Chattopadhyay S, Dobrosz P, Bull S, Hellstrom P-E, Ostling M, Lyutovich K, Kasper E. . In: ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. 2006, Shanghai, China: IEEE Press.
  • Escobedo-Cousin E, Olsen SH, Bull SJ, O'Neill AG, Coulson H, Claeys C, Loo R, Delhougne R, Caymax M. . In: Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. 2006, Princeton, USA: IEEE Press.
  • Olsen SH, Dobrosz P, Bull S, O'Neill A. . In: 33rd International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2006). 2006, San Diego, USA.
  • Dalapati GK, Kwa KSK, Olsen SH, Chattopadhyay S, O'Neill AG, Driscoll LS, Tsang YL, Agaiby R, Escobedo-Cousin E. . In: International Conference on Electronic and Photonic Material, Devices and Systems (EPMDS). 2006, Calcutta, India.
  • Reimer PM, Escobedo-Cousin E, Olsen SH, Evans SE, Tanner BK. . In: Physics in Low Dimensions: Structure Meets Magnetism. 2006, Bochum, Germany.
  • Chang ACK, Norris DJ, Ross IM, Cullis AG, Olsen SH, O'Neill AG. . In: Proceedings of the 14th Conference on Microscopy of Semiconducting Materials (MSM). 2005, Oxford, UK: Springer.
  • O'Neill AG, Olsen SH, Hellstroem P-E, Ostling M, Lyutovich K, Kasper E. . In: European Solid State Device Research Conference (ESSDERC) Workshop. 2005, Grenoble, France.
  • Bull SJ, Dobrosz P, Olsen SH, O'Neill AG. . In: Proceedings of Electronic Materials Conference. 2005, Santa Barbara, USA.
  • Agaiby R, O'Neill AG, Olsen SH. . In: Engineering and Physical Sciences Research Council Annual Conference. 2005, Lancaster, UK.
  • Kwa KSK, Olsen SH, O'Neill AG, Chattopadhyay S, Dalapati G, Driscoll LS. . In: Proceedings of the Electronic Materials Conference. 2005, Santa Barbara, USA.
  • Olsen SH, Driscoll L, Kwa K, Chattopadhyay S, O'Neill AG. . In: International Conference on Solid State Devices and Materials (SSDM). 2005, Tokyo, Japan.
  • Dhar RS, Dalapati GK, Chattopadhyay S, Kwa KSK, Olsen SH, O'Neill AG. . In: Proceedings of the Materials Research Society Conference (MRS). 2005, Boston, Massachusetts, USA.
  • Bull SJ, Dobrosz P, Olsen SH, O'Neill AG. . In: International Conference on Silicon Epitaxy and Heterostructures (ICSI4). 2005, Awaji Island, Japan.
  • Norris DJ, Cullis AG, Olsen SH, O'Neill AG. . Thin Solid Films 2005, 474(1-2), 154-158.
  • Paul DJ, Temple M, Olsen SH, O'Neill AG, Tang YT, Waite AM, Cerrina C, Evans AGR, Li X, Zhang J, Norris DJ, Cullis AG. . In: Materials Science in Semiconductor Processing: 2nd International SiGe Technology and Device Meeting (ISTDM 2004). 2004, Frankfurt (Oder), Germany: Pergamon.
  • Hellstrom P-E, Edholm J, Ostling M, Olsen S, O'Neill A, Lyutovich K, Oehme M, Kasper E. . In: International Semiconductor Device Research Symposium. 2005, Washinton DC, USA: IEEE.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . Surface and Coatings Technology 2005, 200(5-6), 1755-1760.
  • Olsen SH, Kwa KSK, Driscoll LS, Chattopadhyay S, O'Neill AG. . IEE Proceedings: Circuits, Devices and Systems 2004, 151(5), 431-437.
  • Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Norris DJ, Cullis AG, Robbins DJ, Zhang J. . Semiconductor Science and Technology 2004, 19(6), 707-714.
  • Driscoll L, Olsen S, Chattopadhyay S, O'Neill A, Kwa K, Dobrosz P, Bull SJ. . In: Materials Research Society Symposium Proceedings. 2004, San Francisco, CA: Symposium on High-Mobility Group-IV Materials and Devices.
  • Lafford TA, Olsen SH, O'Neill AG, Tanner BK. . In: High Resolution X-Ray Diffraction and Imaging (XTOP). 2004, Prague, Czechoslovakia.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . In: Symposium on High Mobility Group IV Materials and Devices held at the 2004 MRS Spring Meeting. 2004, San Francisco, CA: Materials Research Society.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . Zeitschrift fuer Metallkunde 2004, 95(5), 340-344.
  • Norris DJ, Cullis AG, Olsen SH, O'Neill AG, Zhang J. . In: Microscopy of Semiconducting Materials Conference. 2004, University of Cambridge, UK: Institute of Physics Publishing.
  • Chattopadhyay S, Driscoll LD, Kwa KSK, Olsen SH, O'Neill AG. . Solid-State Electronics 2004, 48(8), 1407-1416.
  • Olsen SH, Kwa KSK, Chattopadhyay S, Driscoll LS, O'Neill AG. . IEE Proceedings: Circuits, Devices and Systems 2004, 151(5), 431-437.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . In: 4th European Symposium on NanoMechanical Testing. 2004, Huckelhoven, Germany: Zeitschrift fuer Metallkunde.
  • Gaspari V, Fobelets K, Ding PW, Velazquez-Perez JW, Olsen SH, O'Neill AG, Zhang J. . IEEE Electron Device Letters 2004, 25(5), 334-336.
  • Gaspari V, Fobelets K, Olsen SH, Velazquez-Perez JE, O'Neill AG, Zhang J. . In: Proceedings of the Electronics Materials Conference. 2004, Notre Dame, Maryland, USA.
  • Olsen SH, O'Neill AG, Norris DJ, Cullis AG, Bull SJ, Chattopadhyay S, Kwa KSK, Driscoll LS, Waite AM, Tang YT, Evans AGR. . Materials Science and Engineering B 2004, 109(1-3), 78-84.
  • Inkson BJ, Olsen S, Norris DJ, O'Neill AG, Mobus G. . In: Conference on Microscopy of Semiconducting Materials. 2003, Cambridge: IOP Publishing.
  • Kwa KSK, Chattopadhyay S, Jankovic ND, Olsen SH, Driscoll LS, O'Neill AG. . Semiconductor Science and Technology 2003, 18(2), 82-87.
  • Chattopadhyay S, Kwa KSK, Olsen SH, Driscoll LS, O'Neill AG. . Semiconductor Science and Technology 2003, 18(8), 738-744.
  • O'Neill AG, Olsen SH. . In: Workshop on Si/SiGe FET Technology. 2003, Ulm, Germany.
  • Driscoll LS, O'Neill AG, Olsen SH, Chattopadhyay S, Kwa KSK. Dual quantum well strained silicon/silicon-germanium n-channel heterojunction metal oxide semiconductor field effect transistors for CMOS logic. In: Proc. PREP. 2003, Exeter, UK.
  • Olsen SH, Driscoll LS, Kwa KSK, Chattopadhyay S, O'Neill AG. . In: International Conference on Solid State Devices and Materials (SSDM). 2003, Tokyo, Japan.
  • Olsen SH, Driscoll LS, Kwa KSK, Chattopadhyay S, O'Neill AG, Waite AM, Tang YT, Evans AGR, Norris DJ, Cullis AG, Paul DJ, Robbins DJ. . In: International Conference on Silicon Epitaxy and Heterostructures (ICSI3). 2003, Santa Fe, New Mexico, USA.
  • Olsen S, Chattopadhyay S, Kwa K, Driscol L, O'Neill A. Impact of Material Quality on High Performance Strained Si/SiGe heterostructure MOSFETs. In: Si Manoelectronics Workshop. 2003, Kyoto, Japan.
  • Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Bull SJ, Waite AM, Tang YT, Evans AGR, Norris DJ, Cullis AG, Zhang J. . In: Electronic Materials Conference (EMC). 2003, Salt Lake City, Utah, USA.
  • Olsen SH, O'Neill AG, Norris DJ, Cullis AG, Fobelets K, Kemhadjian HA. . Solid-State Electronics 2003, 47(8), 1289-1295.
  • Olsen SH, O'Neill AG, Chattopadhay S, Driscoll LS, Kwa KSK, Paul DJ, Zhang J. . In: 2003 International Semiconductor Device Research Symposium (IEEE Cat. No.03EX741). IEEE. 2003. 2003, Washington, DC: IEEE.
  • Olsen SH, O'Neill AG, Norris DJ, Cullis AG, Fobelets K, Kemhadjian HA. . Solid State Electronics 2003, 47(8), 1289-1295.
  • Norris DJ, Cullis AG, Olsen SH, O'Neill AG. . In: Materials Research Society Conference (MRS). 2002, Boston, Massachusetts, USA.
  • Olsen SH, O'Neill AG, Norris DJ, Cullis AG, Woods NJ, Zhang J, Fobelets K, Kemhadjian HA. . Semiconductor Science and Technology 2002, 17(7), 655-661.
  • Olsen SH, O'Neill AG. Analysis of strained Si/SiGe MOSFETs. In: Proc. PREP. 2000, Nottingham, UK.
  • Makovejev S, Olsen SH, Arshad MKM, Flandre D, Raskin JP, Kilchytska V. . In: IEEE International SOI Conference. 2012, Napa, California, USA: IEEE.
  • Bhaskar U, Passi V, Houri S, Escobedo-Cousin E, Olsen SH, Pardoen T, Raskin JP. . Journal of Materials Research 2012, 27(3), 571-579.
  • Urena F, Olsen SH, Siller L, Bhaskar U, Pardoen T, Raskin JP. . Journal of Applied Physics 2012, 112(11), 114506.
  • Escobedo-Cousin E, Olsen SH, Pardoen T, Bhaskar U, Raskin JP. . Applied Physics Letters 2011, 99(24), 241906.
  • Kapoor R, Escobedo-Cousin E, Olsen S, Bull S. . In: Microelectronics Reliability: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. 2010, Gaeta, Italy: Pergamon.
  • Alatise O, Kwa K, Olsen S, O'Neill A. . In: International Semiconductor Device Research Symposium (ISDRS). 2009, College Park, Maryland, USA.
  • De Michielis L, Moselund K, Bouvet D, Dobrosz P, Olsen S, O'Neill A, Lattanzio L, Najmzadeh M, Selmi L, Ionescu A. . In: International Symposium on VLSI Technology, Systems, and Applications, Proceedings. 2009, Hsinchu, Taiwan: IEEE.
  • Olsen SH, Dobrosz P, Escobedo-Cousin E, Bull SJ, O'Neill AG. . In: EMRS 2005, Symposium D: Materials Science and Device Issues for Future Technologies. 2005, Strasbourg, France: Materials Science and Engineering B: Solid-State Materials for Advanced Technology: Elsevier.
  • Olsen S, Temple M, Chattopadhyay S, O'Neill A, Paul DJ, Kwa K, Drsicoll AWL, Tang AEY, Zhang J. . In: Fourth International Conference on Silicon Epitaxy and Heterostructures (ICSi4). 2005, Awaji Island, Japan.
  • Inkson BJ, Olsen S, Norris DJ, O'Neill AG, Mobus G. . In: Microscopy of Semiconducting Materials Conference. 2004, Cambridge University, UK: Institute of Physics.
  • Olsen SH, O'Neill AG, Chattopadhyay S, Kwa KSK, Driscoll LS, Norris DJ, Cullis AG, Robbins DJ, Zhang J. . Journal of Applied Physics 2004, 95(10), 5931-5933.
  • Driscoll L, Olsen S, Chattopadhyay S, O'Neill A, Kwa K, Dobrosz P, Bull S. . In: High-Mobility Group IV Materials and Devices. 2004, San Francisco, California, USA: Materials Research Society.
  • Lafford TA, Olsen SH, Tanner BK, O'Neill AG. . 2004, Prague, Czech.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . In: High-Mobility Group IV Materials and Devices. 2004, San Francisco, California, USA: Materials Research Society.
  • Dobrosz P, Bull SJ, Olsen SH, O'Neill AG. . Materials Research Society Symposium Proceedings: High-Mobility Group-IV Materials and Devices 2004, 809, 340-344.
  • Norris DJ, Cullis AG, Olsen S, O'Neill AG, Waite A, Evans A, Zhang J. . In: Microscopy of Semiconducting Materials Conference. 2003, Cambridge, UK: Taylor & Francis.
  • Olsen S, Driscoll L, Kwa K, Chattopadhyay S, O'Neill A, Waite A, Tang Y, Evans A, Norris D, Cullis A, Paul D, Robbins D. . In: Third International Conference on SiGe(C) Epitaxy and Heterostructures. 2003, Santa Fe, New Mexico, USA.
  • Norris DJ, Cullis AG, Olsen SH, O'Neill AG, Zhang J. . In: Microscopy of Semiconducting Materials: Conference on Microscopy of Semiconducting Materials. 2003, Cambridge, UK: Institute of Physics Publishing.
  • Kwa KSK, Chattopadhyay S, Olsen SH, Driscoll LS, O'Neill AG. . In: 33rd European Solid-State Device Research. 2003, Estoril, Portugal: IEEE.
  • Kwa K, Chattopadhyay S, Olsen S, Driscoll L, O'Neill AG. . In: Proc ESSDERC. 2003, Lisbon, Portugal.
  • Kwa KSK, Chattopadhyay S, Olsen SH, Driscoll LS, O'Neill AG. . In: 33rd European Solid-State Device Research Conference (ESSDERC). 2003, Estoril, Portugal: IEEE.
  • Norris DJ, Cullis AG, Olsen SH, O'Neill AG. . In: Fall MRS. 2002, Boston, Massachusetts, USA.
  • Yazid MM, Olsen SH, Atkinson G. . In: 2016 International Conference for Students on Applied Engineering, ICSAE 2016. 2017, 缅北禁地 upon Tyne: Institute of Electrical and Electronics Engineers Inc.
  • Yazid MM, Olsen SH, Atkinson GJ. . IEEE Transactions on Magnetics 2016, 52(6), 2100610.
  • Urena F, Olsen SH, Raskin JP. Raman measurements of uniaxial strain in silicon nanostructures. JOURNAL OF APPLIED PHYSICS 2013, 114(14).
  • Makovejev S, Olsen SH, Kilchytska V, Raskin JP. . IEEE Transactions on Electron Devices 2013, 60(6), 1844-1851.
  • Olsen SH, Kapoor R, Bull SJ. Scanning Probe Analysis of Dielectrics on High Mobility Substrates. In: DIELECTRICS FOR NANOSYSTEMS 5: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING -AND-TUTORIALS IN NANOTECHNOLOGY: MORE THAN MOORE - BEYOND CMOS EMERGING MATERIALS AND DEVICES. 2012, 65 S MAIN ST, PENNINGTON, NJ 08534-2839 USA: ELECTROCHEMICAL SOC INC.
  • Arith F, Urresti J, Vasilevskiy K, Olsen S, Wright N, O'Neill A. . IEEE Electron Device Letters 2018, 39(4), 564-567.
  • Ghaderi S, Hassan KT, Han X, Wang J, Siller L, Olsen SH. . AIP Advances 2018, 8(6), 065221.